Defect Inspection Equipment - Company Ranking(8 companies in total)

Last Updated: Aggregation Period:Mar 18, 2026〜Apr 14, 2026
This ranking is based on the number of page views on our site.

Company Name Featured Products
Product Image, Product Name, Price Range overview Application/Performance example
【Detection】 Method: Laser scattering method and specular reflection method Detection size: Defects equivalent to PSL 50nm 【Review Funct... For more details, please contact us.
【Main Specifications】 (Model: LE-W1) Detection Method: Laser scattering method, reflection method, phase shift method Detected Defects: ... For more details, please refer to the catalog or feel free to contact us.
By irradiating the surface of the hard disk with a high-power laser, fine surface defects such as scratches and pits are detected, classifie... Hard disk (circuit board/media) surface defect inspection
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  1. Featured Products
    Wafer surface defect inspection device with review functionWafer surface defect inspection device with review function
    overview
    【Detection】 Method: Laser scattering method and specular reflection method Detection size: Defects equivalent to PSL 50nm 【Review Funct...
    Application/Performance example
    For more details, please contact us.
    Laser-type wafer surface defect inspection device - Laser ExplorerLaser-type wafer surface defect inspection device - Laser Explorer
    overview
    【Main Specifications】 (Model: LE-W1) Detection Method: Laser scattering method, reflection method, phase shift method Detected Defects: ...
    Application/Performance example
    For more details, please refer to the catalog or feel free to contact us.
    Hard Disk Surface Defect Inspection Device - Laser ExplorerHard Disk Surface Defect Inspection Device - Laser Explorer
    overview
    By irradiating the surface of the hard disk with a high-power laser, fine surface defects such as scratches and pits are detected, classifie...
    Application/Performance example
    Hard disk (circuit board/media) surface defect inspection